During the HRTEM study at 200 kV of an Indium Tin Oxide specimen fabricated by Glancing Angle Deposition on Silicon, these contrasts aroused within the lattice fringes of a polycristalline confluence region.
During the HRTEM study at 200 kV of an Indium Tin Oxide specimen fabricated by Glancing Angle Deposition on Silicon, these contrasts aroused within the lattice fringes of a polycristalline confluence region.